从47届丹佛X射线会议看X射线荧光分析的发展

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茅祖兴. 从47届丹佛X射线会议看X射线荧光分析的发展[J]. 岩矿测试, 1999, (2): 146-149156.

引用本文:

茅祖兴. 从47届丹佛X射线会议看X射线荧光分析的发展[J]. 岩矿测试, 1999, (2): 146-149156.

Development of XRF Analysis Viewed from the 47th Annual Denver X-ray Conference[J]. Rock and Mineral Analysis, 1999, (2): 146-149156.

Citation:

Development of XRF Analysis Viewed from the 47th Annual Denver X-ray Conference[J]. Rock and Mineral Analysis, 1999, (2): 146-149156.

Development of XRF Analysis Viewed from the 47th Annual Denver X-ray Conference

摘要: 介绍了４７届丹佛Ｘ射线会议的简况。从会议的专题讲座和提交的学术论文可见，全反射Ｘ射线荧光，同步辐射，高能量分辨率超导检出器和聚毛细管光学透交易等新技术的引入，大大地推动了Ｘ射线荧光痕量分析和微分析的发展。

Abstract: The paper briefly describes the 47th annual Denver Xray conference. From workshops arranged and academic reports presented to the conference, it is found that the introduction of many new advanced techniques, such as total reflection Xray fluorescence, sy

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