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周军, 刘笛. X射线荧光光谱熔融片法测定超导材料原子数配比[J]. 岩矿测试, 1997, (2): 155-158.
引用本文: 周军, 刘笛. X射线荧光光谱熔融片法测定超导材料原子数配比[J]. 岩矿测试, 1997, (2): 155-158.
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Determination of Atomic Ratio in Bi_K_Ba Superconductor by XRF with Fusion Disk Technique for Sample Preparation[J]. Rock and Mineral Analysis, 1997, (2): 155-158.
Citation: Determination of Atomic Ratio in Bi_K_Ba Superconductor by XRF with Fusion Disk Technique for Sample Preparation[J]. Rock and Mineral Analysis, 1997, (2): 155-158.
shu

X射线荧光光谱熔融片法测定超导材料原子数配比

Determination of Atomic Ratio in Bi_K_Ba Superconductor by XRF with Fusion Disk Technique for Sample Preparation

    摘要
  • 摘要: 报道了用Ｘ射线荧光光谱测定铋钾钡系超导材料原子配比的方法。测量样片用熔融法制备，测定各组分的质量分数后计算原子配比并推出材料的分子式。

     

    Abstract: A method for the determination of atomic ratio in Bi_K_Ba superconductor by XRF with fusion disk technique for sample preparation was developed. Atomic ratio was calculated after the mass fraction for each component was determined. The molecular formula o

     

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