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茅祖兴. X射线荧光光谱分析用的玻璃熔片与保存时间[J]. 岩矿测试, 1995, (1): 66-68.
引用本文: 茅祖兴. X射线荧光光谱分析用的玻璃熔片与保存时间[J]. 岩矿测试, 1995, (1): 66-68.
Glass Disks for XRF Anal ysis and Their Storage Time[J]. Rock and Mineral Analysis, 1995, (1): 66-68.
Citation: Glass Disks for XRF Anal ysis and Their Storage Time[J]. Rock and Mineral Analysis, 1995, (1): 66-68.

X射线荧光光谱分析用的玻璃熔片与保存时间

Glass Disks for XRF Anal ysis and Their Storage Time

  • 摘要: X射线荧光分析用的Li2B4O7玻璃熔片经长期放置后,Mg,Si和Al等元素的X射线强度发生了很大变化,尤其是Mg的强度增大很多,以至无法进行准确分析,对于长期放置的熔片,可以用重新熔融的方法进行处理。

     

    Abstract: he X-ray intensities of Mg,Si and Al show changes in a long time storage of the Li_2B_4O_7glass disks.The increase of the Mg intensity is so great that the analysis is no longer accurate.However,the difficulty can be overcome by a refusion of the glass di

     

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