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袁静, 刘建坤, 郑荣华, 沈加林. 高能偏振能量色散X射线荧光光谱仪特性研究及地质样品中主微量元素分析[J]. 岩矿测试, 2020, 39(6): 816-827. DOI: 10.15898/j.cnki.11-2131/td.202001070007
引用本文: 袁静, 刘建坤, 郑荣华, 沈加林. 高能偏振能量色散X射线荧光光谱仪特性研究及地质样品中主微量元素分析[J]. 岩矿测试, 2020, 39(6): 816-827. DOI: 10.15898/j.cnki.11-2131/td.202001070007
YUAN Jing, LIU Jian-kun, ZHENG Rong-hua, SHEN Jia-lin. Studies on Characteristics of High-energy Polarized Energy-dispersive X-ray Fluorescence Spectrometer and Determination of Major and Trace Elements in Geological Samples[J]. Rock and Mineral Analysis, 2020, 39(6): 816-827. DOI: 10.15898/j.cnki.11-2131/td.202001070007
Citation: YUAN Jing, LIU Jian-kun, ZHENG Rong-hua, SHEN Jia-lin. Studies on Characteristics of High-energy Polarized Energy-dispersive X-ray Fluorescence Spectrometer and Determination of Major and Trace Elements in Geological Samples[J]. Rock and Mineral Analysis, 2020, 39(6): 816-827. DOI: 10.15898/j.cnki.11-2131/td.202001070007

高能偏振能量色散X射线荧光光谱仪特性研究及地质样品中主微量元素分析

Studies on Characteristics of High-energy Polarized Energy-dispersive X-ray Fluorescence Spectrometer and Determination of Major and Trace Elements in Geological Samples

  • 摘要: 高能偏振能量色散X射线荧光光谱仪由于其高能特性为包括重金属和稀土元素在内的原子序数较大的重元素分析带来了新的契机。本文应用高能偏振X射线荧光光谱仪(HE-P-EDXRF)建立了土壤、岩石和水系沉积物中主微量元素分析方法,对分析线的选择、谱线重叠干扰校正及基体校正模式等进行了探讨,并用不确定度对方法进行了评估。研究表明:①原子序数较大的微量元素选取Kα线作为分析线,谱线重叠干扰较少,有利于获得谱峰净强度,甚至La、Ce和Nd等稀土元素也能够准确测定;②合适的基体校正方法能够改善标准曲线拟合效果;③微量元素Ba和稀土元素La、Ce等,HE-P-EDXRF方法检出限具有明显优势,而对于轻元素WDXRF方法检出限更低;④检验样本除Na2O、MgO、P和Sm外平均相对误差均在15%以下,微量元素相对平均误差在2.40%~16.3%之间,除Cu和Yb外其余微量元素准确度结果显著优于WDXRF;⑤根据欧盟和国际上不确定度的评估方法,除V和Th外,其他微量元素与有证标准物质的认定值间不存在显著性差异。综合来看,本方法更适用于分析岩石、土壤和沉积物等常规地质样品中的微量和稀土元素,解决了此类样品中微量元素对ICP-MS等需复杂化学前处理的分析方法的依赖。

     

    Abstract:
    BACKGROUNDThe quantification of trace elements in geological samples depends largely on the analytical methods that require complex chemical pretreatment. High-energy polarized energy-dispersive X-ray fluorescence spectrometry (HE-P-EDXRF) has a considerable advantage for the determination of trace elements with large atomic numbers, due to its high-energy properties, which can effectively excite the Kα line of heavy elements.
    OBJECTIVESTo establish a HE-P-EDXRF method for quantitative analysis of major and trace elements in geological samples.
    METHODSHE-P-EDXRF was used to establish an analysis method for major and trace elements in soil, rock and water system sediments. The selection of analysis lines, line overlap interference correction and matrix correction modes were discussed. Uncertainty was used to evaluate the method.
    RESULTSThe Kα line was selected as the analysis line for trace elements with a larger atomic number due to less interference from the spectral line overlap, which is beneficial to obtaining the net peak intensity. Rare earth elements such as La, Ce and Nd can be accurately measured. Detection limits of the trace element Ba and rare earth elements such as La, Ce determined by EDXRF were greater than those determined by WDXRF, but lesser for light elements. For all the major and trace elements, the average of relative error of test training data was less than 15% except for Na2O, MgO, P and Sm. The average relative error of trace elements was between 2.40% and 16.3%. The accuracy of trace elements (except Cu and Yb) was significantly better than that of WDXRF. According to the evaluation method of the Europe Union, no significant difference existed between the trace elements results (except V and Th) and the recommended value of certified reference materials.
    CONCLUSIONSHE-P-EDXRF is a simple, fast and environmentally-friendly method that can simultaneously analyze multiple elements in geological samples. This method is suitable for quantification of the trace and rare earth elements in rock, soil and sediment, which overcomes the dependence of quantitative analysis of rare earth and trace elements in geological samples on the need for methods requiring complex chemical pretreatment.

     

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